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US Patent Issued to KLA on Aug. 11 for "System and method for defect detection using deep learning-based image segmentation" (Indian, American Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,724, issued on Aug. 11, was assigned to KLA Corp. (Milpitas, Calif.). "System and method for defect detection using deep learning-based ima... Read More


US Patent Issued to Siemens on Aug. 11 for "Systems and methods for predicting a quality of a printed circuit board assembly" (German Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,725, issued on Aug. 11, was assigned to Siemens AG (Munich). "Systems and methods for predicting a quality of a printed circuit board assem... Read More


US Patent Issued to KEYENCE on Aug. 11 for "Appearance inspection apparatus and appearance inspection method" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,726, issued on Aug. 11, was assigned to KEYENCE Corp. (Osaka, Japan). "Appearance inspection apparatus and appearance inspection method" wa... Read More


US Patent Issued to Sintokogio on Aug. 11 for "Workpiece processing apparatus and method for processing workpiece" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,727, issued on Aug. 11, was assigned to Sintokogio Ltd. (Nagoya, Japan). "Workpiece processing apparatus and method for processing workpiec... Read More


US Patent Issued to Fritz Egger GmbH & Co. OG on Aug. 11 for "Method for identifying wood-based panels" (Austrian Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,728, issued on Aug. 11, was assigned to Fritz Egger GmbH & Co. OG (St. Johann in Tirol, Austria). "Method for identifying wood-based panels... Read More


US Patent Issued to SAMSUNG ELECTRONICS on Aug. 11 for "Method and apparatus with semiconductor image processing" (South Korean Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,729, issued on Aug. 11, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Method and apparatus with semiconductor imag... Read More


US Patent Issued to ASML Netherlands on Aug. 11 for "Charged particle image inspection" (American, Taiwanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,730, issued on Aug. 11, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Charged particle image inspection" was invented by... Read More


US Patent Issued to CHOW SANG SANG JEWELLERY on Aug. 11 for "System and method for gemstone identification" (Chinese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,731, issued on Aug. 11, was assigned to CHOW SANG SANG JEWELLERY COMPANY Ltd. (Hong Kong). "System and method for gemstone identification" ... Read More


US Patent Issued to UNIVERSITAT ZURICH on Aug. 11 for "Method and system for displaying and monitoring a patient's blood coagulation function" (Swiss Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,732, issued on Aug. 11, was assigned to UNIVERSITAT ZURICH (Zurich). "Method and system for displaying and monitoring a patient's blood coa... Read More


US Patent Issued to LUNIT on Aug. 11 for "Method and apparatus for tumor purity based on pathological slide image" (South Korean Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,733, issued on Aug. 11, was assigned to LUNIT INC. (Seoul, South Korea). "Method and apparatus for tumor purity based on pathological slide... Read More